发明名称 Method of manufacturing a semiconductor device
摘要 Contamination of an interface of respective films constituting a TFT due to an contaminant impurity in a clean room atmosphere becomes a great factor to lower the reliability of the TFT. Besides, when an impurity is added to a crystalline semiconductor film, its crystal structure is broken. By using an apparatus for manufacturing a semiconductor device including a plurality of treatment chambers, a treatment can be made without being exposed to a clean room atmosphere in an interval between respective treatment steps, and it becomes possible to keep the interface of the respective films constituting the TFT clean. Besides, by carrying out crystallization after an impurity is added to an amorphous semiconductor film, the breakdown of the crystal structure of the crystalline semiconductor film is prevented.
申请公布号 US2005158922(A1) 申请公布日期 2005.07.21
申请号 US20050066253 申请日期 2005.02.28
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;ASAMI TAKETOMI;ICHIJO MITSUHIRO;MITSUKI TORU;KANAKUBO YOKO
分类号 G02F1/136;G02F1/1368;H01L21/20;H01L21/304;H01L21/336;H01L27/12;H01L29/49;H01L29/786;(IPC1-7):H01L21/84 主分类号 G02F1/136
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