发明名称 Production method for a semiconductor component
摘要 A method for fabricating a semiconductor component includes: deposition of a polysilicon layer on a substrate, deposition of a precursor layer on the polysilicon layer, and deposition of a protective layer on the precursor layer. A crystalline transformation occurs in the precursor layer at a first temperature to form an electrode layer. The layers are patterned to form an electrode stack, and the polysilicon layer is oxidized at a second temperature such that no crystalline transformation occurs in the electrode layer.
申请公布号 US6919269(B2) 申请公布日期 2005.07.19
申请号 US20030477620 申请日期 2003.11.14
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHNEEGANS MANFRED;JAEGER WOLFGANG;BEWERSDORFF-SARLETTE ULRIKE;WEGE STEPHAN
分类号 H01L21/28;H01L21/321;H01L29/49;(IPC1-7):H01L21/44 主分类号 H01L21/28
代理机构 代理人
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