发明名称 AN IMPROVED METHOD OF PROGRAMMING ELECTRONS ONTO A FLOATING GATE OF A NON-VOLATILE MEMORY CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for improving the programming efficiency of a nonvolatile memory cell which has a floating gate for storing electrons. <P>SOLUTION: The method for programming the cell includes a step for forming an inversion layer in a second part of a channel. An electron flow is generated in a drain region which adjoins the inversion layer, and the electron flow reaches a pinch-off point passing through the inversion layer. The electrons are accelerated through a depletion layer by a magnetic line of force from the floating gate with little dispersion or without the dispersion. Thereby, the electrons are accelerated through an insulator making the floating gate separate from a substrate, and the electrons are injected into the floating gate. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 KR20050074336(A) 申请公布日期 2005.07.18
申请号 KR20050003486 申请日期 2005.01.13
申请人 SILICON STORAGE TECHNOLOGY, INC. 发明人 YEH BING;KIANIAN SOHRAB;HU YAW WEN
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115;H01L21/824 主分类号 H01L21/8247
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