发明名称 ELECTRODE TEST METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To easily and expeditiously detect a fault part of an electrode formed on a substrate in manufacturing a plasma display panel or the like. SOLUTION: In a test device of an electrode 13 formed on a substrate 14, this has a substrate temperature adjustment means (heat conductor 16, heater 17, thermocouple 18 and temperature control device 19) to control a temperature of the substrate 14, an electrode temperature control means to control the temperature of the electrode 13, and an infrared ray detecting means (infrared camera 20) to detect infrared rays irradiated from an electrode region in which the electrode 13 is formed, and a non-electrode region other than that electrode region. Then, the test of the electrode 13 is carried out by detecting the infrared rays irradiated from the electrode region in which the electrode 13 is formed and the non-electrode region other than that electrode region by making the respective temperatures of the substrate 14 and the electrode 13 different. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005190673(A) 申请公布日期 2005.07.14
申请号 JP20030426861 申请日期 2003.12.24
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 IKURA TSUNEO;KOBAYASHI KOTARO
分类号 G01N25/72;H01J9/42;H01J11/12;H01J11/22;H01J11/24;H01J11/26;H01J11/34;(IPC1-7):H01J9/42;H01J11/02 主分类号 G01N25/72
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