发明名称 |
Non-contact surface configuration measuring apparatus and method thereof |
摘要 |
A non-contact surface configuration measuring method is provided which allows for accurate measurement of a surface which is at a steep angle to a laser probe. Specific areas including parts inclined ±30° or more from an optimum measurement state relative to the laser probe are measured after a workpiece is rotated such that the surface within the specific areas is less than ±30°. Therefore, accurately measured data on the specific areas can be obtained even in a different coordinate system from that of a general area.
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申请公布号 |
US2005151978(A1) |
申请公布日期 |
2005.07.14 |
申请号 |
US20050033133 |
申请日期 |
2005.01.12 |
申请人 |
NAKAMURA KATSUSHIGE;MIURA KATSUHIRO;KOTAJIMA HIDEO |
发明人 |
NAKAMURA KATSUSHIGE;MIURA KATSUHIRO;KOTAJIMA HIDEO |
分类号 |
G01B11/24;G01B11/255;G01B21/20;G02B21/00;(IPC1-7):G01B11/24 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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