发明名称 Non-contact surface configuration measuring apparatus and method thereof
摘要 A non-contact surface configuration measuring method is provided which allows for accurate measurement of a surface which is at a steep angle to a laser probe. Specific areas including parts inclined ±30° or more from an optimum measurement state relative to the laser probe are measured after a workpiece is rotated such that the surface within the specific areas is less than ±30°. Therefore, accurately measured data on the specific areas can be obtained even in a different coordinate system from that of a general area.
申请公布号 US2005151978(A1) 申请公布日期 2005.07.14
申请号 US20050033133 申请日期 2005.01.12
申请人 NAKAMURA KATSUSHIGE;MIURA KATSUHIRO;KOTAJIMA HIDEO 发明人 NAKAMURA KATSUSHIGE;MIURA KATSUHIRO;KOTAJIMA HIDEO
分类号 G01B11/24;G01B11/255;G01B21/20;G02B21/00;(IPC1-7):G01B11/24 主分类号 G01B11/24
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