发明名称 TESTING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a testing apparatus which visualizes the amount of jitter of an output signal outputted by a device to be tested. SOLUTION: The testing apparatus comprises: a multi-phase strobe generation section which generates a plurality of strobe signals with different timing; a level comparison section which compares a voltage of an output signal outputted by the device to be tested to a preset comparison level at each timing of the plurality of strobe signals and detect the change timing of the output signal; a comparison level setting section which sets a comparison level; a change point counting section which, when the change timing of the output signal is detected a plurality of times at each of the plurality of different comparison levels, counts the number of detection at the comparison level and the change level with correlating to the comparison level and the change level; and a display section which displays information according to the counted number of detection by the change point counting section at corresponding positions of the comparison level and the change timing in a graph with the axes being the comparison level and the change timing. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005189093(A) 申请公布日期 2005.07.14
申请号 JP20030430580 申请日期 2003.12.25
申请人 ADVANTEST CORP 发明人 NAGAI HIROYUKI
分类号 G01R29/02;G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R29/02
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