发明名称 Method and apparatus for automatic scanner defect detection
摘要 Defects are automatically detected in an image scanning device by performing a defect calibration scan of an image scanning area and detecting at least one defect in at least one section of the image scanning area. A tag is generated for the section of the image scanning area in which the defect is detected. The defect is compensated for in the scanned image based on information contained within the tag.
申请公布号 US2005152616(A1) 申请公布日期 2005.07.14
申请号 US20040754123 申请日期 2004.01.09
申请人 BAILEY JAMES R. 发明人 BAILEY JAMES R.
分类号 G06K9/40;(IPC1-7):G06K9/40 主分类号 G06K9/40
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