发明名称 TEST PATTERN PHOTOGRAPHING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a technology for detecting a projected test pattern at a suppressed cost with high accuracy. SOLUTION: A projector 20 projects a test pattern image onto a screen 30. A test pattern photographing apparatus 10 is provided with a plurality of lenses 12-1 to 12-4, and an imaging element 11 to photograph the test pattern image 31 on the screen 30. Each of a plurality of the lenses 12-1 to 12-4 is located side by side between the screen 30 and the imaging element 11, and forms the test pattern image in each of a plurality of photographing regions 32-1 to 32-4 on the screen 30 to each of a plurality of divided faces of the imaging element 11. Thus, the test pattern photographing apparatus 10 magnifies a plurality of particular parts of the test pattern image, in this case, four corner parts of the rectangular test pattern image by using each lens and uses the imaging element 11 to photograph them in parallel at the same time. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005191720(A) 申请公布日期 2005.07.14
申请号 JP20030428027 申请日期 2003.12.24
申请人 NEC VIEWTECHNOLOGY LTD 发明人 TAMURA YOICHI
分类号 G03B21/00;H04N5/74;H04N17/04;(IPC1-7):H04N17/04 主分类号 G03B21/00
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