| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing system for shortening a test time. SOLUTION: An RF semiconductor testing system 10 includes a direct current power source device 30 for supplying prescribed power source voltage to DUT 20, and an output level setting device 70 for setting an output level, when the electrical characteristics of DUT 20 are tested. The output level setting device 70 comprises a detector 70a for detecting an output signal of DUT 20 output from a distribution device 50, a reference voltage output circuit 70b for outputting the reference voltage set previously, a comparator 70c for detecting the difference voltage, by comparing detection voltage of the detector 70a with reference voltage output from a reference voltage output circuit 70b, and a correction voltage conversion circuit 70d converting differential voltage detected with the comparator 70c into correction voltage. COPYRIGHT: (C)2005,JPO&NCIPI
|
