发明名称 |
Probe for combined signals |
摘要 |
A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode. A probe and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a second signal path that avoids the impedance matching resistor.
|
申请公布号 |
US2005151548(A1) |
申请公布日期 |
2005.07.14 |
申请号 |
US20050077810 |
申请日期 |
2005.03.09 |
申请人 |
|
发明人 |
HAYDEN LEONARD;RUMBAUGH SCOTT;ANDREWS MIKE |
分类号 |
G01R1/067;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/067 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|