发明名称 |
GRAY SCALE MASK, METHOD FOR MANUFACTURING OPTICAL DEVICE, METHOD FOR MANUFACTURING SUBSTRATE AND METHOD FOR MANUFACTURING GRAY SCALE MASK |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a high accuracy gray scale mask having transmittance approximate to a designed value. <P>SOLUTION: The gray scale mask is produced by forming a fine pattern on a reticle, reducing and transferring the pattern onto a wafer whose surface is coated with a resist by exposure by using an exposure transfer apparatus, developing the resist and etching the wafer by using the remaining resist as a mask. The distance S between the fine patterns is controlled to be≥0.3λ/NA, wherein NA is the numerical aperture of the exposure apparatus andλis the wavelength of the light used for exposure. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2005189371(A) |
申请公布日期 |
2005.07.14 |
申请号 |
JP20030428696 |
申请日期 |
2003.12.25 |
申请人 |
NIKON CORP |
发明人 |
YONETANI NOBORU;TAKIZAWA KAZUYUKI;OTAKI KATSURA |
分类号 |
G03F1/00;G03F1/70;(IPC1-7):G03F1/08 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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