发明名称 Methods for deposition of semiconductor material
摘要 The invention includes a method for selective deposition of semiconductor material. A substrate is placed within a reaction chamber. The substrate comprises a first surface and a second surface. The first and second surfaces are exposed to a semiconductor material precursor under conditions in which growth of semiconductor material from the precursor comprises a lag phase prior to a growth phase, and under which it takes longer for the growth phase to initiate on the second surface than on the first surface. The exposure of the first and second surfaces is conducted for a time sufficient for the growth phase to occur on the first surface, but not long enough for the growth phase to occur on the second surface.
申请公布号 US2005153551(A1) 申请公布日期 2005.07.14
申请号 US20040755000 申请日期 2004.01.09
申请人 BLOMILEY ERIC R.;SANDHU GURTEJ S.;BASCERI CEM;RAMASWAMY NIRMAL 发明人 BLOMILEY ERIC R.;SANDHU GURTEJ S.;BASCERI CEM;RAMASWAMY NIRMAL
分类号 H01L21/20;H01L21/205;(IPC1-7):C30B1/00;H01L21/36;H01L21/302;H01L21/461 主分类号 H01L21/20
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