发明名称 PROJECTION ALIGNER AND PROJECTION EXPOSURE METHOD
摘要 PROBLEM TO BE SOLVED: To provide a projection aligner and a projection exposure method for reliably and easily correcting aberration generated, when using a hard pellicle. SOLUTION: The projection aligner comprises a light source, an optical system, a reticle stage for retaining reticle, a first position adjustment mechanism for adjusting the position of the reticle, a wafer stage for placing a wafer, a plate for correcting aberration provided between the reticle and the wafer, and an angle adjustment mechanism for adjusting the tilt angle of the plate for correcting aberration. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005191278(A) 申请公布日期 2005.07.14
申请号 JP20030430807 申请日期 2003.12.25
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 SUGANAGA TOSHIFUMI
分类号 G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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