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发明名称
Fehlerdiagnose-RAM eines Speichertesters mit nach Grösse und Geschwindigkeit konfigurierbaren SDRAM Speichereinheiten
摘要
申请公布号
DE60111324(D1)
申请公布日期
2005.07.14
申请号
DE20016011324
申请日期
2001.09.17
申请人
AGILENT TECHNOLOGIES INC., A DELAWARE CORP.
发明人
COOK, III;SINGH, PREET P.;DE LA PUENTE, EDMUNDO
分类号
G01R31/28;G06F12/06;G06F12/16;G11C29/56;(IPC1-7):G11C29/00;G01R31/319;G11C7/10
主分类号
G01R31/28
代理机构
代理人
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地址
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