发明名称 Method for determining depression/protrusion of sample and charged particle beam apparatus therefor
摘要 A method for determining a depression/protrusion, especially of a line and space pattern formed on a sample, and an apparatus therefor. A charged particle beam is scanned with its direction being inclined to the original optical axis of the charged particle beam or a sample stage is inclined, broadening of a detected signal in a line scanning direction of the charged particle beam is measured, the broadening is compared with that when the charged particle beam is scanned with its direction being parallel to the original optical axis of the charged particle beam, and a depression/protrusion of the scanned portion is determined on the basis of increase/decrease of the broadening.
申请公布号 US2005151078(A1) 申请公布日期 2005.07.14
申请号 US20050056191 申请日期 2005.02.14
申请人 TAKANE ATSUSHI;YAMAGUCHI SATORU;KOMURO OSAMU;OZAWA YASUHIKO;TODOKORO HIDEO 发明人 TAKANE ATSUSHI;YAMAGUCHI SATORU;KOMURO OSAMU;OZAWA YASUHIKO;TODOKORO HIDEO
分类号 G01B15/04;G01B15/08;H01J37/28;H01L21/66;(IPC1-7):G01N23/00 主分类号 G01B15/04
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