发明名称 Deposition chamber and method for depositing low dielectric constant films
摘要 An improved deposition chamber ( 2 ) includes a housing ( 4 ) defining a chamber ( 18 ) which houses a substrate support ( 14 ). A mixture of oxygen and SiF<SUB>4 </SUB>is delivered through a set of first nozzles ( 34 ) and silane is delivered through a set of second nozzles ( 34 a) into the chamber around the periphery ( 40 ) of the substrate support. Silane (or a mixture of silane and SiF<SUB>4</SUB>) and oxygen are separately injected into the chamber generally centrally above the substrate from orifices ( 64, 76 ). The uniform dispersal of the gases coupled with the use of optimal flow rates for each gas results in uniformly low (under 3.4) dielectric constant across the film.
申请公布号 US2005150454(A1) 申请公布日期 2005.07.14
申请号 US20040997311 申请日期 2004.11.23
申请人 APPLIED MATERIALS, INC. 发明人 LI SHIJIAN;WANG YAXIN;REDEKER FRED C.;ISHIKAWA TETSUYA;COLLINS ALAN W.
分类号 C23C16/44;C23C14/34;C23C16/40;C23C16/455;H01L21/205;H01L21/31;(IPC1-7):C23C16/00 主分类号 C23C16/44
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