发明名称 |
Deposition chamber and method for depositing low dielectric constant films |
摘要 |
An improved deposition chamber ( 2 ) includes a housing ( 4 ) defining a chamber ( 18 ) which houses a substrate support ( 14 ). A mixture of oxygen and SiF<SUB>4 </SUB>is delivered through a set of first nozzles ( 34 ) and silane is delivered through a set of second nozzles ( 34 a) into the chamber around the periphery ( 40 ) of the substrate support. Silane (or a mixture of silane and SiF<SUB>4</SUB>) and oxygen are separately injected into the chamber generally centrally above the substrate from orifices ( 64, 76 ). The uniform dispersal of the gases coupled with the use of optimal flow rates for each gas results in uniformly low (under 3.4) dielectric constant across the film.
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申请公布号 |
US2005150454(A1) |
申请公布日期 |
2005.07.14 |
申请号 |
US20040997311 |
申请日期 |
2004.11.23 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
LI SHIJIAN;WANG YAXIN;REDEKER FRED C.;ISHIKAWA TETSUYA;COLLINS ALAN W. |
分类号 |
C23C16/44;C23C14/34;C23C16/40;C23C16/455;H01L21/205;H01L21/31;(IPC1-7):C23C16/00 |
主分类号 |
C23C16/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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