| 摘要 |
<P>PROBLEM TO BE SOLVED: To accurately and rapidly carry out creating an LSI inspection specification, checking test program specifications between different devices and considering a programming description enabling the shortest test period to be realized. <P>SOLUTION: Specification file information of every test item 11 which is described in the inspection specification 13, is extracted from a specification file 1 being extracted from the test program, whereby the inspection specification 13 of the test program can be created automatically, accurately and rapidly. Furthermore, in a plurality of test programs which are described by different programming languages and run for inspecting the same LSI, their respective specification files are compared with each other, whereby the presence or absence of difference between respective test programs can be accurately and rapidly checked. In addition, the specification file information of respective test items for the test program is extracted, and a test sequence is considered so as to minimize the amount of specification change of an LSI inspection apparatus, whereby the programming description enabling the shortest test period to be realized can be accurately and rapidly considered. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
