发明名称 CIRCUIT PATTERN TESTING APPARATUS AND CIRCUIT PATTERN TESTING METHOD
摘要 A circuit testing apparatus capable of accurately and easily detecting failures of circuit boards. During testing a pattern arranged in a line, a test signal supplying electrode (35) and test signal detection sensor electrodes (25) are shifted in such a manner that they traverse the tested pattern (15) with a predetermined distance kept therefrom. Meanwhile, test signals, which have been supplied from the supplying electrode (35) through a capacitive coupling to the tested pattern (15), are detected by the sensor electrodes (25) that are also capacitively coupled with the tested pattern. If the successively detected test signal values are constant to some degree, then it is determined that no failures are existent. If the successively detected test signal values exhibit an abrupt change, then it is determined that some failures are existent.
申请公布号 WO2005064354(A1) 申请公布日期 2005.07.14
申请号 WO2004JP19805 申请日期 2004.12.27
申请人 OHT INC.;YAMAOKA, SHUJI;HAMORI, HIROSHI;ISHIOKA, SHOGO 发明人 YAMAOKA, SHUJI;HAMORI, HIROSHI;ISHIOKA, SHOGO
分类号 G01R31/02;G01R31/28;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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