发明名称 Automated inspection and processing system
摘要 An automated inspection system is provided wherein an inspection of a surface and the processing of inspection data acquired from the surface can be performed with limited or no operator involvement and wherein a high level of consistency can be s maintained between each inspection and between each processing of inspection data across multiple inspections of the surface.
申请公布号 US2005151841(A1) 申请公布日期 2005.07.14
申请号 US20040508850 申请日期 2004.09.24
申请人 NELSON BRUCE N.;SLEBODNICK PAUL;LEMIEUX EDWARD J.;KRUPA MATT;SINGLETON WILLIAM 发明人 NELSON BRUCE N.;SLEBODNICK PAUL;LEMIEUX EDWARD J.;KRUPA MATT;SINGLETON WILLIAM
分类号 G01N21/88;G01N21/90;(IPC1-7):H04N7/18 主分类号 G01N21/88
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