发明名称 METHOD OF MANUFACTURING A TRENCH-GATE SEMICONDUCTOR DEVICE
摘要 A method of making a trench MOSFET includes forming a nitride liner 50 on the sidewalls 28 of a trench and a plug of doped polysilicon 26 at the bottom of a trench. The plug of polysilicon 26 may then be oxidised to form a thick oxide plug 30 at the bottom of the trench whilst the nitride liner 50 protects the sidewalls 28 from oxidation. This forms a thick oxide plug at the bottom of the trench thereby reducing capacitance between gate and drain.
申请公布号 WO2004055882(A8) 申请公布日期 2005.07.14
申请号 WO2003IB06014 申请日期 2003.12.08
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;HIJZEN, ERWIN, A.;HUETING, RAYMOND, J., E.;IN 'T ZANDT, MICHAEL, A., A. 发明人 HIJZEN, ERWIN, A.;HUETING, RAYMOND, J., E.;IN 'T ZANDT, MICHAEL, A., A.
分类号 H01L21/28;H01L21/336;H01L29/423;H01L29/51;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/28
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