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发明名称
METHOD OF MEASURING THRESHOLD VOLTAGE AND CELL CURRENT FOR A FLASH MEMORY DEVICE
摘要
申请公布号
KR20050073294(A)
申请公布日期
2005.07.13
申请号
KR20040001649
申请日期
2004.01.09
申请人
HYNIX SEMICONDUCTOR INC.
发明人
KIM, DOE COOK
分类号
G11C16/34;(IPC1-7):G11C16/34
主分类号
G11C16/34
代理机构
代理人
主权项
地址
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