Signal processor and apparatus and method for testing same

摘要

An apparatus for testing a signal processor includes an integrator and a control section. The integrator switches an input signal in response to a first clock signal to allow the input signal to be charged in at least one capacitive element, and outputs the charged input signal in response to a second clock signal. The control section is coupled to the integrator, and provides the integrator with a control signal to discharge the capacitive elements based on a level of the input signal at a previous part of a test mode. The time required for testing the signal processor is reduced.