发明名称 Semiconductor thin film forming system
摘要 <p>In a semiconductor thin film forming system for modifying a predetermined region of a semiconductor thin film by exposing the semiconductor thin film to projected light patterned through a pattern formed on a photo mask, the system includes a mechanism (opt20') for uniformizing the light for exposure in a predetermined area on the photo mask. This system can provide a crystallized silicon film having a trap state density less than 1012 cm -2 and can provide a silicon-insulating film interface exhibiting a low interface state density.</p>
申请公布号 KR100499961(B1) 申请公布日期 2005.07.11
申请号 KR20000038851 申请日期 2000.07.07
申请人 发明人
分类号 H01L21/027;H01L21/205;B23K26/06;B23K26/067;B23K26/073;C23C14/28;H01L21/20;H01L21/268;H01L21/336;H01L29/786;H01S3/00;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址