发明名称 |
On-chip timing characterizer |
摘要 |
An on-chip timing measurement circuit for improving skew measurement and timing parameter characterization in integrated logic circuits providing increased accuracy and range. The measurement circuit includes a chip delay element characterization circuit for determining chip specific delay values having one output connected to a second control input of the programmable delay generator and receiving an output from the programmable delay generator for providing a value corresponding to the measured chip specific delay element timing, the characterization circuit being enabled by a control signal from the analyzer during a setup phase of the measurement cycle thereby enhancing the accuracy of the measurement for both skew measurement and timing parameter characterization.
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申请公布号 |
US2005149778(A1) |
申请公布日期 |
2005.07.07 |
申请号 |
US20040953896 |
申请日期 |
2004.09.29 |
申请人 |
STMICROELECTRONICS PVT. LTD. |
发明人 |
TIWARI NAVEEN |
分类号 |
G01R13/00;G01R29/26;G06F19/00;G06K5/04;G11B5/00;G11B20/20;H03L7/00;(IPC1-7):G06F19/00 |
主分类号 |
G01R13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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