发明名称 DEVICE MANUFACTURING METHOD AND MASK FOR USE THEREIN
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a device manufacturing method and a mask by which an improved contrast can be obtained on a substrate level in projection exposure. <P>SOLUTION: The mask has a quartz-made transparent substrate Q and an absorber layer AB where a pattern is formed of, for example, chromium or chromium oxide, wherein the thickness (t) of the absorber layer AB is larger than the wavelengthλof a projection beam PB and three to four times as large as the width (b) of the absorber layer. The thick absorber layer causes TE polarized light (sagittal or s-polarized light) in transmitted light to increase. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005182031(A) 申请公布日期 2005.07.07
申请号 JP20040364656 申请日期 2004.12.16
申请人 ASML NETHERLANDS BV 发明人 DIERICHS MARCEL MATHIJS THEODORE MARIE;EURLINGS MARKUS FRANCISCUS A;FLAGELLO DONIS GEORGE
分类号 G03F1/08;G03F7/00;G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/08
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