发明名称 |
SEMICONDUCTOR CARRIER, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To increase the second mounting reliability of a semiconductor device by preventing a problem with falling off of an external connection terminal from a semiconductor carrier, destruction of an external connection terminal, or the like which tends to occur when the semiconductor carrier having a linear expansion coefficient largely different from that of a mounting substrate is used to form a semiconductor device. <P>SOLUTION: A plurality of electrodes 5 and a wiring pattern connected to the electrodes 5 are formed on the upper surface of an insulating substrate 4. An external connection terminal 7 electrically connected with the wiring pattern is formed on the lower surface of the insulating substrate 4. A semiconductor element 2 having a plurality of projected electrodes 1 joined to the plurality of electrodes 5 is mounted. In a semiconductor carrier 3 connected to a mounting substrate 10 via the external connection terminal 7, a first insulating coating material 11 for increasing an adhesion between the insulating substrate 4 and the external connection terminal 7 is arranged on the lower surface of the insulating substrate 4 to cover at least the outer periphery of the external connection terminal 7. A second insulating coating material 12 for suppressing warpage or deformation in the insulating substrate 4 caused by the first insulating coating material 11 is arranged on the upper surface of the insulating substrate 4. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2005183856(A) |
申请公布日期 |
2005.07.07 |
申请号 |
JP20030426027 |
申请日期 |
2003.12.24 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NONOYAMA SHIGERU;YUI TAKASHI |
分类号 |
H01L23/12;H01L21/60;(IPC1-7):H01L21/60 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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