发明名称 |
Manufacturing method of solid-state image pickup device, and solid-state image pickup device |
摘要 |
A p-type region of a light receiving section is formed by implanting boron ions from the direction normal to a semiconductor substrate. The ion implantation conditions of boron are a few hundred to 4 MeV for the ion implantation energy, 1x10<SUP>10 </SUP>to 1x10<SUP>12 </SUP>ions/cm<SUP>2 </SUP>for the implanted dose, and 0 degree±0.2 degrees for an ion implantation angle (theta) with respect to the direction normal to the surface of the semiconductor substrate.
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申请公布号 |
US2005145963(A1) |
申请公布日期 |
2005.07.07 |
申请号 |
US20040021846 |
申请日期 |
2004.12.23 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
SAITOH SATOSHI |
分类号 |
H01L27/148;H01L21/00;H01L21/265;H01L27/14;H01L27/146;H01L31/00;H01L31/10;H04N5/335;H04N5/369;(IPC1-7):H01L21/00 |
主分类号 |
H01L27/148 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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