发明名称 METHOD AND APPARATUS FOR SELECTING POSITIVE CHARACTERISTIC THERMISTOR
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce a selection work cost, reduce an installation cost, and improve selection work efficiency by shortening the application time of voltage in a method and an apparatus for selecting a positive characteristic thermistor. <P>SOLUTION: An attenuated current waveform obtained by applying voltage to each positive characteristic thermistor as a selection object is detected, and the average and the standard deviation of the attenuation current waveform of the positive characteristic thermistor are calculated. An upper limit value and a lower limit value are calculated using the average value±n×the standard deviation (n=3 to 6.) on the basis of the average value and the standard deviation. Consequently, it is judged whether or not the attenuation current waveform of each positive characteristic thermistor falls within a judgement range between the upper limit value and the lower limit value, and an article falling within the judgement range is selected as a good one. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005183674(A) 申请公布日期 2005.07.07
申请号 JP20030422455 申请日期 2003.12.19
申请人 MURATA MFG CO LTD 发明人 NAKAMURA OSAMU;TSUJI SHIRO;TANAKA YUTAKA
分类号 H01C17/00;H01C7/02;(IPC1-7):H01C7/02 主分类号 H01C17/00
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