发明名称 |
Marking semiconductor wafers by converting identification numbers into binary coded pattern which is projected bit by bit onto resist layer, followed by etching |
摘要 |
<p>A resist (4) is applied to the surface of the semiconductor wafer (2), which includes a substrate (1). The projector (3) shades (6) limit the field of illumination during photolithographic projection. The wafer is laid on a moveable substrate holder in the projection apparatus. From a prepared identification label, a binary number is formed and converted to a representative, planar, binary-coded pattern (5). For each bit of the binary number, the holder is moved and the cited photolithographic projection takes place. The resist layer is then etched to form structural elements (10) of the binary coded pattern.</p> |
申请公布号 |
DE10357775(A1) |
申请公布日期 |
2005.07.07 |
申请号 |
DE2003157775 |
申请日期 |
2003.12.10 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
BRUCH, JENS UWE;HASSE, HOLGER;KISS, ANDREAS |
分类号 |
G03F7/20;H01L23/544;(IPC1-7):H01L23/544 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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