| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a testing apparatus which can examine the jitterproof strength of an electronic device, with precision. <P>SOLUTION: The testing device for examining an electronic device, which impresses definite jitters without making a given inputted signal produce an amplitude modulation component, is provided with a definite jitter impression means for supplying to an electronic device, a jitter amount control means for controlling the size of the definite jitters which the definite jitter impression means impresses, and a deciding means which decides the quality of an electronic device from the output which the electron device outputs, according to the inputted signal. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
