发明名称 Low cost test option using redundant logic
摘要 A test scheme which includes a drive circuit connected to a plurality of IP cores (such as memory blocks, processors (i.e., ARM, MIPS, ZSP) or special types of IO's (i.e., Gigablaze, Hyperphi)). The drive circuit is configured to simultaneously send the same input stimuli to each of the IP cores. Outputs of the IP cores are run through a comparator, and the comparator is configured to identify when the outputs from the IP cores are not identical.
申请公布号 US2005147048(A1) 申请公布日期 2005.07.07
申请号 US20040752942 申请日期 2004.01.07
申请人 HAEHN STEVEN L. 发明人 HAEHN STEVEN L.
分类号 G01R31/317;G01R31/3193;H04L1/00;(IPC1-7):H04L1/00 主分类号 G01R31/317
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