发明名称 |
Method for measuring surface plasmon resonance |
摘要 |
An object of the present invention is to suppress the noise width of a reference cell during measurement and the base line fluctuation. The present invention provides a method for measuring a change in surface plasmon resonance, which comprises: using a surface plasmon resonance measurement device comprising a flow channel system having a cell formed on a metal film and a light-detecting means for detecting the state of surface plasmon resonance by measuring the intensity of a light beam totally reflected on the meal film; and exchanging the liquid contained in the above flow channel system, wherein the above method is characterized in that a change in surface plasmon resonance is measured in a state where the flow of the liquid has been stopped, after the liquid contained in the above flow channel system has been exchanged.
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申请公布号 |
US2005146723(A1) |
申请公布日期 |
2005.07.07 |
申请号 |
US20040000401 |
申请日期 |
2004.12.01 |
申请人 |
FUJI PHOTO FILM CO., LTD. |
发明人 |
KURUMA KOJI;TSUZUKI HIROHIKO |
分类号 |
G01N21/05;G01N21/27;G01N21/55;G01N33/543;(IPC1-7):G01N1/10 |
主分类号 |
G01N21/05 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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