发明名称 Semiconductor processing equipment having improved process drift control
摘要 A plasma processing chamber including a slip cast part having a surface thereof exposed to the interior space of the chamber. The slip cast part includes free silicon contained therein and a protective layer on the surface which protects the silicon from being attacked by plasma in the interior space of the chamber. The slip cast part can be made of slip cast silicon carbide- coated with CVD silicon carbide. The slip cast part can comprise one or more parts of the chamber such as a wafer passage insert, a monolithic or tiled liner, a plasma screen, a showerhead, dielectric member, or the like. The slip cast part reduces particle contamination and reduces process drift in plasma processes such as plasma etching of dielectric materials such as silicon oxide.
申请公布号 US2005145176(A1) 申请公布日期 2005.07.07
申请号 US20050072316 申请日期 2005.03.07
申请人 LAM RESEARCH CORPORATION 发明人 WICKER THOMAS E.
分类号 H01J37/32;(IPC1-7):C23C16/00 主分类号 H01J37/32
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