发明名称 APPARATUS AND PROCESS FOR SENSING FLUORO SPECIES IN SEMICONDUCTOR PROCESSING SYSTEMS
摘要 A gas detector (54) and process for detecting a fluorine-containing species in a gas containing same, e.g., an effluent of a semiconductor processing tool undergoing etch cleaning with HF, NF3, etc. The detector in a preferred structural arrangement employs a microelectromechanical system (MEMS)-based device structure and/or a free-standing metal element (8) that functions as a sensing component and optionally as a heat source when elevated temperature sensing is required. The free-standing metal element can be fabricated directly onto a standard chip carrier/device package (6) so that the package becomes a platform of the detector.
申请公布号 KR20050071590(A) 申请公布日期 2005.07.07
申请号 KR20057006671 申请日期 2003.10.15
申请人 ADVANCED TECHNOLOGY MATERIALS INC. 发明人 FRANK DIMEO;PHILIP S.H. CHEN;JEFFREY W. NEUNER;JAMES WELCH;MICHELE STAWASZ;THOMAS H. BAUM;MACKENZIE E. KING;ING SHIN CHEN;JEFFREY F. ROEDER
分类号 G01N33/00;(IPC1-7):G01N27/04 主分类号 G01N33/00
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