发明名称 Amorphous etch stop for the anisotropic etching of substrates
摘要 Methods of forming an amorphous etch stop layer by implanting a substrate with an element that is electrically neutral within the substrate are described. The use of elements that are electrically neutral within the substrate prevents electrical interference by the elements if they diffuse to other areas within the substrate. The amorphous etch stop layer may be used as a hard mask in the fabrication of transistors or other devices such as a cantilever.
申请公布号 US2005148147(A1) 申请公布日期 2005.07.07
申请号 US20030750054 申请日期 2003.12.30
申请人 KEATING STEVEN;AUTH CHRIS 发明人 KEATING STEVEN;AUTH CHRIS
分类号 H01L21/265;H01L21/306;H01L21/308;H01L21/336;H01L29/165;(IPC1-7):H01L21/336;H01L21/311;H01L21/302;H01L21/461 主分类号 H01L21/265
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