发明名称 |
LITHOGRAPHIC APPARATUS, ILLUMINATION SYSTEM, AND METHOD FOR PROVIDING PROJECTION BEAM OF EUV RADIATION |
摘要 |
PROBLEM TO BE SOLVED: To provide a lithographic apparatus that is not influenced by problems caused by particles that are produced by the by-product of EUV radiation production. SOLUTION: The lithographic apparatus has an illumination system supplying a beam of radiation and a supporting structure supporting a patterning structure arranged. The patterning structure is formed to impart patterns to the cross section of the radiation beam. Moreover, the apparatus has a substrate support supporting a substrate and a projection system for projecting the patterned beam onto the target portion of the substrate. The illumination system has a radiation producing system of producing extreme ultraviolet radiation and a radiation collecting system of collecting extreme ultraviolet radiation arranged. The particles produced as the by-product of extreme ultraviolet radiation production move substantially in a particle movement direction. The radiation collecting system is regulated in such a manner as to collect the extreme ultraviolet radiation that radiates in the collecting direction that is largely different from the particle movement direction. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005183950(A) |
申请公布日期 |
2005.07.07 |
申请号 |
JP20040350743 |
申请日期 |
2004.12.03 |
申请人 |
ASML NETHERLANDS BV |
发明人 |
IVANOV VLADIMIR VITALEVICH;BANINE VADIM YEVGENYEVICH;KOSHELEV KONSTANTIN NIKOLAEVITCH |
分类号 |
G21K5/02;G03F7/20;H01L21/027;H05G2/00;(IPC1-7):H01L21/027 |
主分类号 |
G21K5/02 |
代理机构 |
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代理人 |
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