发明名称 Single reactor, multi-pressure chemical vapor deposition for semiconductor devices
摘要 An apparatus and method for forming at least a portion of an electronic device include a High Vacuum-Chemical Vapor Deposition (UHV-CVD) system and a Low Pressure-Chemical Vapor Deposition (LPCVD) system using a common reactor. The invention overcomes the problem, of silicon containing wafers being dipped in HF acid prior to CVD processing, and the problem of surface passivation between processes in multiple CVD reactors.
申请公布号 US2005145172(A1) 申请公布日期 2005.07.07
申请号 US20050057176 申请日期 2005.02.15
申请人 IBM CORPORATION (BURLINGTON) 发明人 CHU JACK O.;JAGANNATHAN BASANTH;WUTHRICH RYAN W.
分类号 C23C16/44;C23C16/54;C30B25/08;C30B25/14;(IPC1-7):C23C16/00;C23C16/24 主分类号 C23C16/44
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