| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for precision mass measurements of product ions of samples. SOLUTION: The ion precision mass measuring method by Trap-TOF/μs comprises a step of generating ions of the sample to be measured and a reference material; a step of guiding and trapping the ions of both the sample to be measured and the reference material in an ion trap; a step of selecting precursor ions from among the ions of the sample to be measured and excluding other ions, except the precursor ions and the ions of the reference material in the ion trap; a stap of exciting and making the precursor ions cleaved to produce product ions; a step of discharging the precursor ions, their product ions, and the ions of the reference material trapped in the ion trap from the ion trap and guiding them to a time-of-flight mass spectrometer; and a step of measuring mass spectrum in the time-of-flight mass spectrometer. On the basis of the measured ions of the reference material, the correction of the precision mass of the product ions is conducted. COPYRIGHT: (C)2005,JPO&NCIPI
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