发明名称 INTERFEROMETER AND OPTICAL CHARACTERISTIC MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an interferometer capable of reducing a frequency residue waviness causing the lowering of measurement accuracy. SOLUTION: This interferometer comprises a light flux dividing means 41 for dividing a light flux from a light source 1 into reference light and measuring light; a measuring means 7 for measuring the characteristic of an optical system 5 to be measured by measuring the interference state between the reference light and the measuring light via the optical system 5 to be measured; and an aperture diaphragm 8 arranged between the optical system 5 to be measured and the measuring means 7. The interferometer is constituted so that the light transmittance of an aperture part of the aperture diaphragm 8 is gradually reduced from the center part toward the peripheral part of the aperture part of the aperture diaphragm 8. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005181043(A) 申请公布日期 2005.07.07
申请号 JP20030420681 申请日期 2003.12.18
申请人 NIKON CORP 发明人 KOMATSUDA HIDEKI
分类号 G01B9/02;G01J9/02;G01M11/02;(IPC1-7):G01M11/02 主分类号 G01B9/02
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