发明名称 |
Non-volatile memory and fabricating method thereof |
摘要 |
A non-volatile memory structure and a fabricating method thereof are described. In the fabricating method, a mask layer is formed over a substrate first. A trench is formed in the mask layer and the substrate, and then a tunnel dielectric layer is formed in the trench. A floating gate is formed inside the trench, and then the mask layer is removed. A high-voltage doped region is formed in the substrate on one side of the floating gate, serving as a first source/drain region and a control gate simultaneously. A second source/drain region is then formed in the substrate on the other side of the floating gate.
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申请公布号 |
US2005145920(A1) |
申请公布日期 |
2005.07.07 |
申请号 |
US20030707650 |
申请日期 |
2003.12.30 |
申请人 |
CHANG KO-HSING;HUANG CHIU-TSUNG |
发明人 |
CHANG KO-HSING;HUANG CHIU-TSUNG |
分类号 |
H01L21/8247;H01L27/115;H01L29/423;H01L29/788;(IPC1-7):H01L29/788 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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