发明名称 THERMAL ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To perform highly accurately a flow measurement or composition analysis of gas generated from a sample simultaneously with a thermal analysis of thermal gravity and differential heat or the like. SOLUTION: This thermal analysis device has a constitution wherein a material generating a phase change from a liquid at a room temperature to gas at a high temperature at which the thermal analysis is performed is circulated in a sample chamber 104, and a non-condensable gas is circulated through components connected to other measuring instruments, to thereby prevent condensation of the phase-changing material, and exhaust gas passing a sample plate 101 or the like is prevented from being mixed with the non-condensable gas. Hereby, the thermal analysis is performed, while maintaining thermal analysis accuracy similar to hitherto, and since the gas generated from a sample gas can be collected in high concentration, the flow measurement or the composition analysis of the generated gas can be performed highly accurately. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005181112(A) 申请公布日期 2005.07.07
申请号 JP20030422545 申请日期 2003.12.19
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TANAKA MASAAKI;OZAKI HITOSHI;MORITOMI HIROSHI;SHIMIZU HIROSHI
分类号 G01N25/20;G01N5/04;(IPC1-7):G01N25/20 主分类号 G01N25/20
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