摘要 |
A surface acoustic wave device has a significantly improved frequency temperature characteristic due to the arrangement of a SiO<SUB>2 </SUB>film on an IDT such that cracking in the SiO<SUB>2 </SUB>film surface is prevented from occurring, desired characteristics are reliably achieved, the electromechanical coupling coefficients is increased, and the attenuation constant alpha is reduced. In the surface acoustic wave device, at least one IDT primarily including Ag is arranged on a 20° to 60°-rotated Y plate LiTaO<SUB>3 </SUB>substrate, and the SiO<SUB>2 </SUB>film is arranged on the LiTaO<SUB>3 </SUB>substrate while covering the IDT. |