发明名称 Dedicated redundancy circuits for different operations in a flash memory device and methods of operating the same
摘要 A flash memory device can include a first redundancy circuit configured to provide read repair information for read operations to the flash memory. The flash memory device can also include a second redundancy circuit, separate from the first redundancy circuit, configured to provide write repair information for write operations to the flash memory. The flash memory device can include a dedicated-read operation redundancy circuit configured to provide read repair information and a dedicated-write operation redundancy circuit configured to provide write repair information. The flash memory device can include also include a first redundancy circuit configured to store an address of a defective memory cell in the flash memory and a second redundancy circuit, separate from the first redundancy circuit, configured to store the address of the defective memory cell.
申请公布号 US6914814(B2) 申请公布日期 2005.07.05
申请号 US20030630116 申请日期 2003.07.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 IM JAE-WOO;LIM YOUNG-HO
分类号 G11C16/06;G11C7/00;G11C11/34;G11C29/00;G11C29/04;(IPC1-7):G11C16/06 主分类号 G11C16/06
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