发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device includes a semiconductor layer, a plurality of semiconductor elements formed on the semiconductor layer, and an isolation film provided in a surface of the semiconductor layer, semiconductor elements being electrically isolated from each other by the isolation film. The semiconductor device also includes a PN junction portion provided under the isolation film and formed by two semiconductor regions of different conductivity types in the semiconductor layer. The isolation film includes a nitride film provided in a position corresponding to a top of the PN junction portion and has a substantially uniform thickness across the two semiconductor regions and an upper oxide film and a lower oxide film which are provided in upper and lower portions of the nitride film. The surface of the semiconductor layer is silicidized in such a state that a surface of the isolation film is exposed.
申请公布号 US6914307(B2) 申请公布日期 2005.07.05
申请号 US20030657068 申请日期 2003.09.09
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 IWAMATSU TOSHIAKI;IPPOSHI TAKASHI;NARUOKA HIDEKI;HATTORI NOBUYOSHI;MAEGAWA SHIGETO;YAMAGUCHI YASUO;MATSUMOTO TAKUJI
分类号 H01L21/76;H01L21/762;H01L21/84;H01L27/01;H01L27/08;H01L27/12;H01L29/45;H01L29/786;(IPC1-7):H01L29/76 主分类号 H01L21/76
代理机构 代理人
主权项
地址