发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
A semiconductor device includes a semiconductor layer, a plurality of semiconductor elements formed on the semiconductor layer, and an isolation film provided in a surface of the semiconductor layer, semiconductor elements being electrically isolated from each other by the isolation film. The semiconductor device also includes a PN junction portion provided under the isolation film and formed by two semiconductor regions of different conductivity types in the semiconductor layer. The isolation film includes a nitride film provided in a position corresponding to a top of the PN junction portion and has a substantially uniform thickness across the two semiconductor regions and an upper oxide film and a lower oxide film which are provided in upper and lower portions of the nitride film. The surface of the semiconductor layer is silicidized in such a state that a surface of the isolation film is exposed.
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申请公布号 |
US6914307(B2) |
申请公布日期 |
2005.07.05 |
申请号 |
US20030657068 |
申请日期 |
2003.09.09 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
IWAMATSU TOSHIAKI;IPPOSHI TAKASHI;NARUOKA HIDEKI;HATTORI NOBUYOSHI;MAEGAWA SHIGETO;YAMAGUCHI YASUO;MATSUMOTO TAKUJI |
分类号 |
H01L21/76;H01L21/762;H01L21/84;H01L27/01;H01L27/08;H01L27/12;H01L29/45;H01L29/786;(IPC1-7):H01L29/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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