发明名称 High efficiency triple well charge pump circuit
摘要 An improved charge pump circuit is provided using a triple-well structure where the charge pump circuit has a plurality of stages containing N-channel MOSFET devices in which each stage is contained in a P-well within a Deep N-well residing on a P-substrate. Each pump stage is formed in its own P-well and the pumping stages are serially connected from power supply source to the output terminal. Each pumping stage includes a charge transfer device, a first auxiliary device to precharge the gate of the charge transfer device with a voltage from the previous stage, and a second auxiliary device to switch coupling between the charge transfer device and its substrate region to reduce the body effect and increases the capacitive boosting effect. The multiple stages of circuitry are clocked from either a four-phase clock or a two-phase clock.
申请公布号 US6914791(B1) 申请公布日期 2005.07.05
申请号 US20030602228 申请日期 2003.06.24
申请人 HALO LSI, INC. 发明人 PARK KI-TAE;KOJI SHIMENO;OGURA TOMOKO
分类号 H02M3/07;(IPC1-7):H02M3/07 主分类号 H02M3/07
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