发明名称 SECONDARY ION MASS SPECTROMETRY
摘要 PROBLEM TO BE SOLVED: To provide a method capable of highly accurate analysis even when a portion to be analyzed is positioned on the end of a sample. SOLUTION: The sample 1 having the portion 2 to be analyzed on the end thereof is put into a container 3, and a conductive resin 5 is injected, cured, and taken out from the container 3 after being cured. Hereby, a conductive region having the approximately same plane as the portion 2 on the side face adjacent to the portion 2 of the sample 1 is formed, to thereby acquire the sample to be used for measurement. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005172587(A) 申请公布日期 2005.06.30
申请号 JP20030412111 申请日期 2003.12.10
申请人 FUJI ELECTRIC HOLDINGS CO LTD 发明人 UEKI HIROKO
分类号 G01N23/225;G01N1/36;G01N27/62;(IPC1-7):G01N23/225 主分类号 G01N23/225
代理机构 代理人
主权项
地址