发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having a good hetero structure that a crystal defect or the roughness of an interface is improved and having stable characteristics, and to provide a method of manufacturing the same. SOLUTION: The semiconductor device 100 includes a semiconductor layer, a gate insulating layer 26 formed on the semiconductor layer, and a gate electrode 28 formed on the gate insulating layer 26. The semiconductor layer has a hetero structure that a first layer (SiGe layer 14) containing at least Si and Ge, and a second layer (Si layers 13, 16) having a composition different from the first layer and containing at least an Si are laminated in such a manner that a carbon exists in the interface region between the first layer and the second layer. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005175082(A) 申请公布日期 2005.06.30
申请号 JP20030410659 申请日期 2003.12.09
申请人 SEIKO EPSON CORP 发明人 KATO JURI
分类号 H01L21/205;H01L21/20;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/205
代理机构 代理人
主权项
地址