发明名称 NMOS device, PMOS device, and SiGe HBT device formed on SOI substrate and method of fabricating the same
摘要 Provided are an NMOS device, a PMOS device and a SiGe HBT device which are implemented on an SOI substrate and a method of fabricating the same. In manufacturing a Si-based high speed device, a SiGe HBT and a CMOS are mounted on a single SOI substrate. In particular, a source and a drain of the CMOS are formed of SiGe and metal, and thus leakage current is prevented and low power consumption is achieved. Also, heat generation in a chip is suppressed, and a wide operation range may be obtained even at a low voltage.
申请公布号 US2005139921(A1) 申请公布日期 2005.06.30
申请号 US20040019179 申请日期 2004.12.23
申请人 KANG JIN Y.;LEE SEUNG Y.;CHO KYOUNG I. 发明人 KANG JIN Y.;LEE SEUNG Y.;CHO KYOUNG I.
分类号 H01L27/092;H01L21/331;H01L21/8228;H01L21/84;H01L27/12;(IPC1-7):H01L27/01 主分类号 H01L27/092
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