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发明名称
Ereignisbasiertes IC-Testsystem
摘要
申请公布号
DE10392667(T5)
申请公布日期
2005.06.30
申请号
DE20031092667T
申请日期
2003.05.19
申请人
ADVANTEST CORP., TOKIO/TOKYO
发明人
RAYSUMAN, ROCHIT;SAUER, ROBERT F.;SUGAMORI, SHIGERU;YAMOTO, HIROAKI;TURNQUIST, JAMES ALAN;LE, ANTHONY;PARNAS, BRUCE R.
分类号
G01R31/28;G01R31/3181;G01R31/3183;G01R31/319;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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