发明名称 SEMICONDUCTOR ELEMENT INCLUDING METAL-INSULATOR-METAL CAPACITOR, AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor element including metal-insulator-metal capacitor, and to provide a manufacturing method of the same. SOLUTION: A manufacturing method of a semiconductor element, wherein after a first metal layer and a dielectric film are sequentially formed on an insulating film 120, the dielectric is left only on the part where the dielectric film is patterned and a metal-insulator-metal capacitor 160 is formed, and a second metal layer is formed on the dielectric film and the first metal layer. The second metal layer, the dielectric film and the first metal layer are patterned at once; on one side are formed with wiring 152 and 155 having a first and second metal layers 135a, 135a', 145a, 145a' laminated thereon; and on the other side are formed with a lower electrode 135b composed of the first metal layer, a dielectric film 140b, and the metal-insulator-metal capacitor 160, including an upper electrode 145b composed of the second metal layer. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005175491(A) 申请公布日期 2005.06.30
申请号 JP20040356440 申请日期 2004.12.09
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM SUNG-HOON;SHIN HEON-JONG
分类号 H01L23/52;H01L21/02;H01L21/3205;H01L21/768;H01L21/822;H01L23/522;H01L27/04;H01L27/108;H01L29/92;(IPC1-7):H01L21/822;H01L21/320 主分类号 H01L23/52
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